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Whispering-gallery modes in a microsphere coated with a high-refractive index layer: polarization-dependent sensitivity enhancement of the resonance-shift sensor and TE–TM resonance matching

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Abstract

Sensitivity enhancement of a whispering-gallery-mode microsphere resonance-shift sensor by coating of a high-refractive index (RI) layer is examined for TM polarization. The enhancement of sensitivity in response to particle adsorption or a RI change of the surroundings at the optimized layer thickness is greater for the TM mode compared with the TE mode, but the TM mode requires a thicker layer. A particular choice of the layer thickness allows the TE and TM shifts to match. Matching of the resonance frequency of the two modes is also examined.

© 2007 Optical Society of America

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