Abstract
Absolute frequency measurements, with uncertainties as low as , are presented for the band of at . The measurements were made using cavity-enhanced, diode-laser-based saturation spectroscopy. With one laser system stabilized to the line of and a system stabilized to the line in whose frequency was to be determined, a Cr:YAG laser-based frequency comb was employed to measure the frequency intervals. The systematic uncertainty is notably reduced relative to that of previous studies, and the region of measured lines has been extended. Improved molecular constants are obtained.
© 2006 Optical Society of America
Full Article | PDF ArticleMore Like This
Alan A. Madej, John E. Bernard, A. John Alcock, Andrzej Czajkowski, and Sergei Chepurov
J. Opt. Soc. Am. B 23(4) 741-749 (2006)
Jie Jiang, John E. Bernard, Alan A. Madej, Andrzej Czajkowski, Sibyl Drissler, and David J. Jones
J. Opt. Soc. Am. B 24(10) 2727-2735 (2007)
Feng-Lei Hong, Atsushi Onae, Jie Jiang, Ruixiang Guo, Hajime Inaba, Kaoru Minoshima, Thomas R. Schibli, Hirokazu Matsumoto, and Ken’ichi Nakagawa
Opt. Lett. 28(23) 2324-2326 (2003)