Abstract

Z-scan measurement with a slit instead of a circular aperture is proposed and analyzed for an astigmatic Gaussian beam. This new technique can accurately determine not only the nonlinear refractive index but also the ellipticity and positions of $x–y$ foci of the astigmatic beam.

© 2000 Optical Society of America

Variational analysis of z scan of thick medium with an elliptic Gaussian beam

Wei-Ping Zang, Jian-Guo Tian, Zhi-Bo Liu, Wen-Yuan Zhou, Chun-Ping Zhang, and Guang-Yin Zhang
Appl. Opt. 42(12) 2219-2225 (2003)

Effects of beam ellipticity on Z-scan measurements

S. M. Mian, B. Taheri, and J. P. Wicksted
J. Opt. Soc. Am. B 13(5) 856-863 (1996)

Theory of Gaussian beam Z scan with simultaneous third- and fifth-order nonlinear refraction based on a Gaussian decomposition method

Bing Gu, Jing Chen, Ya-Xian Fan, Jianping Ding, and Hui-Tian Wang
J. Opt. Soc. Am. B 22(12) 2651-2659 (2005)

Local one-dimensional approximation for fast simulation of Z-scan measurements with an arbitrary beam

Wei-Ping Zang, Jian-Guo Tian, Zhi-Bo Liu, Wen-Yuan Zhou, Feng Song, and Chun-Ping Zhang
Appl. Opt. 43(22) 4408-4414 (2004)

Z-scan technique for characterizing third-order optical nonlinearity by use of quasi-one-dimensional slit beams

Bing Gu, Jun Yan, Qin Wang, Jing-Liang He, and Hui-Tian Wang
J. Opt. Soc. Am. B 21(5) 968-972 (2004)