Abstract
Spatial modification of a Gaussian beam reflected from a single interface and a thin film with intensity-dependent refractive index and absorption coefficient is studied theoretically. The measurement of this modification by different positions of the nonlinear surface with respect to the beam waist (the modified Z-scan technique) can be used to study nonlinear optical properties. For a single interface the measurements permit the nonlinear parameters to be determined unambiguously. For a thin film the multiple internal reflections are important, and the value and the sign of nonlinear refraction and absorption coefficients cannot be uniquely found.
© 1996 Optical Society of America
Full Article | PDF ArticleMore Like This
Trenton R. Ensley, Sepehr Benis, Honghua Hu, Zhong’an Li, Sei-Hum Jang, Alex K.-Y. Jen, Joseph W. Perry, Joel M. Hales, David J. Hagan, and Eric W. Van Stryland
Appl. Opt. 58(13) D28-D33 (2019)
Chong Hoon Kwak, Yeung Lak Lee, and Seong Gyu Kim
J. Opt. Soc. Am. B 16(4) 600-604 (1999)
Wei-Ping Zang, Jian-Guo Tian, Zhi-Bo Liu, Wen-Yuan Zhou, Feng Song, Chun-Ping Zhang, and Jing-Jun Xu
J. Opt. Soc. Am. B 21(2) 349-356 (2004)